Microanalysis of Solids

An Introduction to Microanalysis of Solids; B.G. Yacobi, D.B. Holt. Scanning Electron Microscopy; B.G. Yacobi, D.B. Holt. Transmission Electron Microscopy; A.J. Garratt-Reed. Augur Electron Spectroscopy; L.L. Kazmerski. Secondary Ion Mass Spectrometry; S.E. Asher. Applications of MeV Ion Beams in Materials Analysis; P. Revesz, J. Li. Confocal Microscopy; T. Wilson. XRay Microscopy; A.G. Michette, A.C. Potts. XRay Photoemission Spectroscopy; A. Nelson. Laser Ionization Mass Spectrometry; R.W. Odom, F. Radicati di Brozolo. Microellipsometry; R.F. Cohn. Scanning Acoustic Microscopy; P. Mutti, G.A.D. Briggs. Field Emission, Field Ion Microscopy, and the Atom Probe; J.J. Hren, J. Liu. Scanning Probe Microscopy; D.A. Grigg, P.E. Russell. Index.