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Advances in X-Ray Analysis: Volume 22


Advances in X-Ray Analysis: Volume 22
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Lieferzeit: 21 Werktage

  • 10365653


Beschreibung

Special Techniques in Powder Diffraction.- Special Handling Problems in X-Ray Diffractometry.- Special Problems in Forensic Materials Analysis by XRD.- X-Ray Powder Diffraction Measurements in Reactive Atmospheres at 1000 °C and 7 MPa (1000 psig).- X-Ray Diffraction of Radioactive Materials.- Characterization of Thin Films by X-Ray Fluorescence and Diffraction Analysis.- Characterization of Laterites By X-Ray Techniques.- Minimization of Preferred Orientation in Powders by Spray Drying.- Low Temperature X-Ray Diffractometer with Closed Cycle Refrigeration System.- X-Ray Powder Diffraction of Einsteinium Compounds.- Evaluation of XRD Patterns.- Identification of Multiphase Unknowns by Computer Methods: Role of Chemical Information, the Quality of X-Ray Powder Data and Subfiles.- The Control and Processing of Data from an Automated X-Ray Powder Diffractometer.- A Preliminary Report on the Design and Results of the Second Round Robin to Evaluate Search/Match Methods for Qualitative Powder Diffractometry.- Application of Guinier Camera, Microcomputer Controlled Film Densitometry, and Pattern Search-Match Procedures to Rapid Routine X-Ray Powder Diffraction Analysis.- Computer Automation of X-Ray Powder Diffraction.- A Microcomputer Controlled Diffractometer.- Applications of XRD.- X-Ray Powder Diffraction Investigation of the Monumental Stone of the Castel dell'ovo, Naples, Italy.- Quantitative Phase Analysis of Devonian Shales by Computer Controlled X-Ray Diffraction of Spray Dried Samples.- X-Ray Diffraction Studies of Stabilities of Zeolites to Temperature Changes and Solution Treatment.- Applications of the Gandolfi X-Ray Camera in Minerals Industry Research.- Instrumental Techniques for the Analysis of Paper Fillers and Pigments.- Investigations of Detection Threshold Variation and Microcrystallite Nucleation in Nuclear Track Detectors Using Small Angle X-Ray Analysis.- Application of Microbeam X-Ray Techniques to the Evaluation of The Plastic Zone Size of Fatigued Steels.- Residual Stress at Fatigue Fracture Surface of Heat Treated High Strength Steels.- Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter.- Comparison of Stress Measurements by X-Rays with Three Different Detectors and a Strongly Fluorescing Specimen.- Use of Cr K-Beta X-Rays and Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe (Note).- Instrumentation and Laser Sources.- A Diffractometer Based Energy Dispersive Elemental Analyser (Note).- A New Method for Fast XRPD Using A Position Sensitive Detector.- Laser-Produced Plasmas as an Alternative X-Ray Source for Synchrotron Radiation Research and for Microradiography.- Mathematical Data Analysis for XRF.- A Review of Empirical Influence Coefficient Methods in X-Ray Spectrometry.- Quasi-Fundamental Correction Methods Using Broadband X-Ray Excitation.- Progress in X-Ray Fluorescence Correction Methods Using Scattered Radiation.- Development of the Detector Response Function Approach for the Library Least-Squares Analysis of Energy-Dispersive X-Ray Fluorescence Spectra.- X-Ray Fluorescence Analysis of Stainless Steels and Low Alloy Steels Using Secondary Targets and the Exact Program.- The Resolution of X-Ray Fluorescence Spectra by the Least Squares Method.- The Reduction of Matrix Effects in X-Ray Fluorescence Analysis by the Monte Carlo, Fundamental Parameters Method.- 'Pareds'-An Interactive on-Line System for the Interpretation of EDXRF Data.- Variation in Intensity Ratios Used to Identify Asbestos Fibers.- Use of a New Versatile Interactive Regression Analysis Program for X-Ray Fluorescence Analysis.- Modelling Intensity and Concentration in Energy Dispersive X-Ray Fluorescence.- XRF Applications.- Quantitative Analysis of 300 And 400 Series Stainless Steel by Energy Dispersive X-Ray Fluorescence.- Energy-Dispersive X-Ray Analysis for Carbon on and in Steels.- Determination of Solids Content in Slurries by X-Ray Scattering.- Developments i

Eigenschaften

Breite: 170
Höhe: 244
Seiten: 492
Sprachen: Englisch
Autor: Gregory J. McCarthy

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