Advances in X-Ray Analysis: Volume 32

I. High Brilliance Sources/Applications.- Synchrotron Radiation X-Ray Fluorescence Analysis.- X-Ray Diffraction Using Synchrotron Radiation - A Catalysis Perspective.- II. On-Line X-Ray Analysis.- On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements.- Process Control Applications of the Peltier Cooled SI(LI) Detector Based EDXRF Spectrometer.- Application of Fundamental Parameter Software to On-Line XRF Analysis.- On-Stream XRF Measuring System for Ore Slurry Analysis.- Applications of On-Line XRF and XRD Analysis Techniques to Industrial Process Control.- On-Site Tests of a New XRD/XRF On-Line Process Analyzer.- III. Xrf Mathematical Models and Quantitation.- Concepts of Influence Coefficients in XRF Analysis and Calibration.- Painless XRF Analysis Using New Generation Computer Programs.- Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications.- What Can Data Analysis do for X-Ray Microfluorescence Analysis?.- The Determination of Rare Earth Elements in Geological Samples by XRF Using the Proportional Factor Method.- IV. Techniques And XRF Instrumentation.- How to Use the Features of Total Reflection of X-rays for Energy Dispersive XRF.- Applications of a Laboratory X-Ray Microprobe to Materials Analysis.- Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System.- Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry.- Micro X-Ray Fluorescence Analysis with Synchrotron Radiation.- X-Ray Microprobe Studies Using Multilayer Focussing Optics.- V. XRF Applications.- Resolution Enhancement for Cu K-alpha Emission of Y-Ba-Cu-O Compounds.- Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts.- High Resolution X-Ray Fluorescence Si K? Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts.- Quantitative Analysis of Fluorine and Oxygen by X-Ray Fluorescence Spectrometry Using a Layered Structure Analyzer.- The Homogeneity of Fe, Sr and Zr in SL-3/Lake Sediment Standard Reference Material by Radioisotope Induced X-Ray Emission..- Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-Ray Fluorescence Spectrometry.- Impurity Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence Analysis.- Sample Treatment for TXRF - Requirements and Prospects.- Sample Preparation Optimization for EDXRF Analysis of Portland Cement.- The Viability of XRF Determination of Gold in Mineral Reconnaissance.- An Improved Fusion Technique for Major-Element Rock Analysis by XRF.- Modern Alloy Analysis and Identification with a Portable X-Ray Analyzer.- Low Level Iodine Detection by TXRF Spectrometry.- The Application of P-32 and Sn-113 Radionuclides for the Determination of Noble Metals.- Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-Ray Fluorescence Spectrometry.- VI. Analysis of Thin Films by XRD and XRF.- X-Ray Diffraction Analysis of High Tc Superconducting Thin Films.- Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method.- Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction.- Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method.- X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins.- X-Ray Diffraction Studies of Polycrystalline Thin Films Using Glancing Angle Diffractometry.- Density Measurement of Thin Sputtered Carbon Films.- Determination of Ultra-Thin Carbon Coating Thickness by X-Ray Fluorescence Technique.- VII. X-Ray Stress Analysis.- Separation of the Macro- and Micro-Stresses in Plastically Deformed 1080 Steel.- Effect of Plastic Deformation on Oscillations in "d" vs. Sin2? Plots A FEM Analysis.- X-Ray Diffractometric Determination of Lattice Misfit Between ? and ?' Phases in Ni-Base Superalloys - Conventional X-Ray Source vs. Synchro