Optical Characterization of Thin Solid Films
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- Artikel-Nr.: 10386125
Beschreibung
Introduction and modelling activities.- Optical film characterization topics: An overview.- Universal dispersion model for characterization of optical thin films over wide spectral range.- Predicting optical properties of oxides from ab initio calculations.- Spectrophotometry and spectral ellipsometry.- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry.- Data processing methods for imaging spectrophotometry.- In-situ and ex-situ spectrophotometry in thin film characterization.- Ellipsometric characterization of thin solid films.- Characterization of defective and corrugated coatings.- Optical characterization of thin films exhibiting defects.- Scanning probe microscopy characterization of optical thin films.- Resonant grating waveguide structures.- Absorption and scatter.- Roughness and scatter in optical coatings.- Absorption and fluorescence measurements in optical coatings.- Cavity ring-down technique for optical coating characterization.
Eigenschaften
Breite: | 156 |
Gewicht: | 741 g |
Höhe: | 236 |
Länge: | 27 |
Seiten: | 462 |
Sprachen: | Englisch |
Autor: | Miloslav Ohlídal, Olaf Stenzel |
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