Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

157.15 CHF

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Lieferzeit: 7-14 Werktage

Beschreibung

1. Introduction (Sadewasser, Glatzel)

Part I: Technical Aspects

2. Experimental technique and working modes (Th. Glatzel, S. Sadewasser)

3. Dissipation KPFM (Y. Miyahara)

4. KPFM techniques for liquid environment (K. Kobayashi)

5. Open-loop and excitation KPFM (S. Kalinin, S. Jesse)

6. Quantitative KPFM on semiconductor devices (R. Wijngaarden)

7. KPFM with atomic resolution (Y. Sugawara)

8. Time-resolved KPFM (S. Sadewasser)

Part II: Theoretical Aspects

9. Local dipoles in atomic and Kelvin probe force microscopy (R. Perez)

10. Influence of the tip electrostatic fie

ld on high resolution KPFM measurements (P. Jelinek)

11. Modelling the electrostatic field of a cantilever (Ch. Loppacher, L. Nony)

12. Theory of open-loop KPFM (A. Kuehnle)

13. KPFM in a SPM simulator (A. Foster, L. Kantorovich)

14. Electrostatic interactions with dielectric samples (A. Sadeghi)

Part III: Applications

15. Kelvin spectroscopy of single molecules (L. Gross)

16. KPFM for single molecule chemistry (I. Swart)

17. Optoelectronic properties of single molecules (T. Meier, Th. Glatzel)

18. Quantitative KPFM of molecular self-assemblies (P. Rahe)

19. Applications of KPFM in liquids (B. Rodriguez)

20. KPFM of organic solar cell materials (B. Grevin)

21. Correlation of optical and electrical nanoscale properties of organic devices (D. Ginger)

22.&n

bsp; KPFM for catalysis (C. Barth)

23. Quantitative electrical measurements of SiC devices (U. Gysin, Th. Glatzel)

Breite:	164
Gewicht:	978 g
Höhe:	241
Länge:	37
Seiten:	521
Sprachen:	Englisch
Autor:	Sascha Sadewasser, Thilo Glatzel

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