Spectroscopic Ellipsometry for Photovoltaics: Volume 2: Applications and Optical Data of Solar Cell
Lieferzeit: 7-14 Werktage
- Artikel-Nr.: 10475003
Beschreibung
Introduction.- Part I: Application of Ellipsometry Technique.- Analysis of Optical and Recombination Losses in Solar Cells.- Optical Simulation of External Quantum Efficiency Spectra.- Characterization of Textured Structures.- On-line Monitoring of Photovoltaics Production.- Real Time Measurement, Monitoring, and Control of CuIn1 xGaxSe2 by Spectroscopic Ellipsometry.- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells.- Part II: Optical Data of Solar-Cell Component Materials.- Inorganic Semiconductors and Passivation Layers.- Organic Semiconductors.- Organic-Inorganic Hybrid Perovskites.- Transparent Conductive Oxides.- Metals.- Substrates and Coating Layers.
Eigenschaften
Breite: | 160 |
Gewicht: | 1094 g |
Höhe: | 242 |
Länge: | 40 |
Seiten: | 616 |
Sprachen: | Englisch |
Autor: | Hiroyuki Fujiwara, Robert W. Collins |