Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
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- Artikel-Nr.: 10317912
Beschreibung
From the contents:
- Introduction
- Reliability, Faults and Fault Models
- Nanotechnology and Nanodevices
- Fault-Tolerant Architectures and Approaches
- Reliability Evaluation Techniques
- Averaging Design Implementations
- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions
- System Level Reliability Evaluation and Optimization
- Summary and Conclusions
- References
- Introduction
- Reliability, Faults and Fault Models
- Nanotechnology and Nanodevices
- Fault-Tolerant Architectures and Approaches
- Reliability Evaluation Techniques
- Averaging Design Implementations
- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions
- System Level Reliability Evaluation and Optimization
- Summary and Conclusions
- References
Eigenschaften
Breite: | 155 |
Gewicht: | 476 g |
Höhe: | 235 |
Seiten: | 195 |
Sprachen: | Englisch |
Autor: | Alexandre Schmid, Milos Stanisavljevic, Yusuf Leblebici |
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