Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturin

Preface. 1. Overview of Design, Manufacture, and Reliability. 2. Integrating Reliability into Microelectronics Manufacturing. 3. Basic Reliability Concept. 4. Yield and Modeling Yield. 5. Reliability Stress Tests. 6. Burn-In Performance, Cost, and Statistical Analysis. 7. Nonparametric Reliability Analysis. 8. Parametric Approaches to Decide Optimal System Burn-In Time. 9. Nonparametric Approach and Its Applications to Burn-In. 10. Nonparametric Bayesian Approach for Optimal Burn-In. 11. The Dirichlet Process for Reliability Analysis. 12. Software Reliability and Infant Mortality Period of the Bathtub Curve. Epilogue: Cost-Effective Design for Stress Burn-In. References. Appendices: A. Notation and Nomenclature. B. Failure Modes for Parts. C. Common Probability Distributions. D. Simulation for U-Shaped Hazard Rate Curves. E. Sample Programs. Index.