Radiation Effects on Integrated Circuits and Systems for Space Applications
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- Artikel-Nr.: 10383390
Beschreibung
Chapter1: Space and Radiation Environments.- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU.- Chapter3: Single Event Effects Test Methods.- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects.- Chapter5: Microprocessor Testing.- Chapter6: Fault Injection Methodologies.- Chapter7: Mitigation techniques and Error prediction applied in Multicore processors.- Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach.- Chapter9: System Hardening and Real Applications.- Chapter10: Backward Error Recovery in SRAM based FPGA.- Chapter11: Development of a Hardened 150nm Standard Cell library.- Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability.- Chapter13: COTS & the NewSpace.- Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications - An Example for the Successful Utilization of COTS Technology in Space Projects.- Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI.- Chapter16: COTS for Deep Space Missions.
Eigenschaften
Breite: | 160 |
Gewicht: | 768 g |
Höhe: | 295 |
Länge: | 29 |
Seiten: | 401 |
Sprachen: | Englisch |
Autor: | Dale McMorrow, Jaime Estela, Raoul Velazco |
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