IDDQ Testing of VLSI Circuits
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- Artikel-Nr.: 10292244
Beschreibung
IDDQ Testing: A Review.- Iddq Testing as a Component of a Test Suite: The Need for Several Fault Coverage Metrics.- Iddq Testing in CMOS Digital ASICs.- Reliability Benefits of IDDQ.- Quiescent Current Analysis and Experimentation of Defective CMOS Circuits.- QUIETEST: A Methodology for Selecting IDDQ Test Vectors.- Generation and Evaluation of Current and Logic Tests for Switch-Level Sequential Circuits.- Diagnosis of Leakage Faults with IDDQ.- Algorithms for IDDQ Measurement Based Diagnosis of Bridging Faults.- Proportional BIC Sensor for Current Testing.- Design of ICs Applying Built-in Current Testing.
Eigenschaften
Gewicht: | 476 g |
Höhe: | 254 |
Seiten: | 124 |
Sprachen: | Englisch |
Autor: | Charles F. Hawkins, Ravi K. Gulati |
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